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Characterization - Temporal Noise in Single Photon
Il y a 2 mois
Position description
**Posting title**:
- Characterization - Temporal Noise in Single photon Avalanche Diodes M/F
**Regular/Temporary**:
- Temporary
**Contract duration (nb of months)**:
- 6
**Job description**:
- In the context of developing new single photon avalanche photodiodes (SPAD) at STMicroelectronics, we are looking to hire an intern to help us characterize temporal noise in such devices.
- The intern will join a young and dynamic research and development team dedicated to electro-optical characterization of cutting-edge CMOS image sensors and SPAD sensors.
- The aim of this 6-months internship will be to study the temporal noise observed in SPAD sensors and more particularly random telegraphic signal related to dark current (DRTS).
- The intern will be directly involved in the development and the improvement of this particular characterization technique as well as the analysis of the collected data on state-of-the-art technology. Through his/her work, the intern will acquire fundamental skills and knowledge in the art of microelectronics devices characterization, statistical data analysis, semiconductor physics and results reporting and sharing.
- The job offer is located in Crolles (38), a major production and R&D site of STMicroelectronics, 15 minutes away from Grenoble city.
**Profile**:
- This mission requires a good knowledge of the English language (spoken and written) and a strong understanding of the physics of semiconductors and microelectronic devices (diode, transistors, and so on ).
Position location
**Job location**:
- Europe, France, Crolles
**Education level required**:
- 4 - Bachelor degree
**Experience level required**:
- Less than 2 years
**Languages**:
- English (2- Business fluent)
Requester
**Desired start date**:
- 09/01/2023
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